Higher education teachers: Bojkovski Jovan, Drnovšek Janko
Subject description
Prerequisits:
- Enrolment in 2. Year of undergraduate study – Technical quality
Content (Syllabus outline):
- EU classification of metrology (legal, scientific, industrial), international organizations (BIPM, OIML, EURAMET)
- Basic SI units, definitions and realizations (realization of basic SI units in Slovenia)
- Basic metrological terms (uncertainty, correction, systematic error, …)
- Measurement uncertainty (type A(statistical) and type B(non-statistical))
- Typical uncertainty sources, estimation and calculation of uncertainty, calibration procedures, examples from different technical areas
- Basic probability and information theory in measurements
- Modern software and hardware tools in metrological laboratories (emphasizes on basic SI units)
Objectives and competences:
- Understanding of metrological system, hierarchy of international organizations, EU classifications, linkage of Slovenian metrological system with international system
- Acquire knowledge regarding basic and other SI units, understand definitions, realizations and dissimenation of units, traceability to higher hierarchical levels
- Presentation of measurement results (uncertainty, correction, ...)
- Uncertainty sources in electrical and non-electrical measurements
- Basic statistical probability distribution used in measurement science for analysis of measurement results and uncertainty
- Technologies and instrumentation
- Understanding and correctly solving measurement problems
Knowledge and understanding:
basic knowledge about metrology, understanding how modern metrological systems are made, advanced technical quality items
Learning and teaching methods:
- Lectures,
- seminars,
- laboratory exercises.
Study materials
Readings:
- DRNOVŠEK, Janko, BOJKOVSKI, Jovan, GERŠAK, Gregor, PUŠNIK, Igor, HUDOKLIN, Domen, GERŠAK, Gregor, Metrologija, ; Fakulteta za elektrotehniko 2012
- BIPM: "The International System of Units (SI)", 8 izdaja, 2006
- BIPM Evaluation of measurement data — Guide to the expression of uncertainty in measurement, JCGM 100:2008
- BIPM, International vocabulary of metrology – Basic and general concepts and associated terms (VIM), JCGM 200:2012
- Morris, A.S.: Measurement and Instrumentation: Theory and Application, ELSEVIER, 2011